Following many of the principles outlined in ASTM method E165798.
Reference conditions:
Wavelength: 230 nm/4 nm with Reference Wavelength 360 nm/100 nm, Slitwidth 4 nm, TC 2 s, (or with RT = 2.2 * TC), ASTM
G4212-60008 (Max-Light Cartridge Cell (10 mm, V(σ) 1.0 μL)) with flow of 0.5 mL/min LC grade water or G4212-60011 (Max-Light Cartridge Test Cell)
Linearity:
Linearity is measured with caffeine at 273 nm/4 nm with slit width 4 nm and TC 1 s (or with RT 2 s) with G4212-60008 (Max-Light Cartridge Cell (10 mm, V(σ) 1.0 μL)) > 2.0 AU (5 %) [ typical 2.5 AU (5 %) ] .
NOTE
The specifications are based on the standard RFID tag lamp (5190-0917) and may be not achieved when other lamp types or aged lamps are used.
ASTM drift tests require a temperature change below 2 °C/hour (3.6 F/hour) over one hour period. Our published drift specification is based on these conditions (refer to Specifications, Specifications and Specifications). Larger ambient temperature changes will result in larger drift.
Better drift performance depends on better control of the temperature fluctuations. To realize the highest performance, minimize the frequency and the amplitude of the temperature changes to below 1 °C/hour (1.8 F/hour). Turbulences around one minute or less can be ignored.
Performance tests should be done with a completely warmed up optical unit (> two hours). ASTM measurements require that the detector should be turned on at least 24 h before start of testing.
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