Following many of the principles outlined in ASTM method E165798.
Reference conditions: cell path length 10 mm, wavelength 254 and 750 nm with reference wavelength 360 nm/100 nm, slit width 4 nm, time constant 2 s (equal to response time 4 s), flow 1 mL/min LC-grade Methanol.
Linearity: Linearity is measured with caffeine at 273 nm/4 nm with slit width 4 nm and TC 2 s (or with RT 4 s) with 10 mm pathlength.
For environmental conditions, see Environment.
NOTE
The specifications are based on the standard RFID tag lamp (2140-0820) and may be not achieved when other lamp types or aged lamps are used.
NOTE
Mobile devices used close to the intstrument could affect the detector's short term noise level.
ASTM drift tests require a temperature change below 2 °C/hour (3.6 °F/hour) over one hour period. Our published drift specification is based on these conditions (refer to Specification of the G7115A Diode Array Detector WR and Specifications of the G7165A Multiple Wavelength Detector). Larger ambient temperature changes will result in larger drift.
Better drift performance depends on better control of the temperature fluctuations. To realize the highest performance, minimize the frequency and the amplitude of the temperature changes to below 1 °C/hour (1.8 °F/hour). Turbulences around one minute or less can be ignored.
Performance tests should be done with a completely warmed up optical unit (> two hours). ASTM measurements require that the detector should be turned on at least 24 h before start of testing.
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