For the Instant Pilot Rescale the plot and measure the baseline noise and drift on the screen. If a printer is configured for the instrument the plot can be printed by pressing the m key and selecting Print Plot.
The following values are calculated automatically by the Agilent ChemStation.
Noise (ASTM): The short term noise in nRIU based on ASTM method E-1303-95 Practice for Refractive Index Detectors used in Liquid Chromatography using 0.5 minute segments.
Wander: The long term noise in nRIU based on ASTM method E-1303-95 ractice for Refractive Index Detectors used in Liquid Chromatography using 0.5 minute segments.
Drift: The drift in nRIU/hour based on ASTM method E-1303-95 Practice for Refractive Index Detectors used in Liquid Chromatography measured over 20 minutes.
Factors that will affect the baseline stability include:
Variations in the optics or eluent temperature
Pressure fluctuations in the sample cell
The quality of the water used
Air bubbles in the flow cell
For diagnosing signal problems refer to chapter Troubleshooting and Diagnostics .
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